XRD – X-Ray Diffraction
The X-ray diffraction (XRD) is used for the analysis of crystalline substances. During the analysis an X-ray beam is diffracted by the ordered components contained in the sample. By detecting the scattering intensity in relation to the direction of the reflected beam it is possible to determine crystal structures and identify and quantify crystalline phases. Since the spectra of crystalline substances are unique, reference data from different databases can be used to assign the X-ray diffraction patterns.
The qualitative characterization by X-ray diffraction is applied for example for pharmaceuticals, chemicals, oxides, catalysts, pigments or soil samples.
The micro X-ray diffraction is applied especially for the examination of very small areas. By generating a very thin X-ray beam inclusions or contaminations can be specifically analyzed for example.
High-resolution X-ray diffraction measurements (HRXRD) allow an analysis of thin crystalline layers. Structural parameters such as layer thickness and composition can also be analyzed of multilayer materials.